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International Journal of Engineering، جلد ۲۹، شماره ۹، صفحات ۱۲۴۷-۱۲۵۶
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| عنوان فارسی |
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| چکیده فارسی مقاله |
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| کلیدواژه‌های فارسی مقاله |
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| عنوان انگلیسی |
Look up Table Based Low Power Analog Circuit Testing |
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| چکیده انگلیسی مقاله |
In this paper, a method of low power analog testing is proposed. In spite of having Oscillation Based Built in Self-Test methodology (OBIST), a look up table based (LUT) low power testing approach has been proposed to find out the faulty circuit and also to sort out the particular fault location in the circuit. In this paper an operational amplifier, which is the basic building block in the analog circuit, is designed and is taken for testing purpose. Fault coverage is identified after fault modeling, fault injection and fault simulation. More than 93% fault coverage is achieved and there is a scope of increasing more fault coverage. Since analog testing prefaces the challenge of power dissipation during testing, some power minimization techniques like sleepy stack method and current correlation method have adhered during the testing process. Test power reduction up to 84 % is achieved in this work. |
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| کلیدواژه‌های انگلیسی مقاله |
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| نویسندگان مقاله |
Laxmana Maharana |
ECE, National Institute of Technology, Agartala
Trupa Sarkar |
ECE, National Institute of technology, Agartala
Sambhu Pradhan |
ECE, National Institute of technology, Agartala
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| نشانی اینترنتی |
http://www.ije.ir/article_72791_b1393dbe2069cdcc9bc0b6a1e949b92d.pdf |
| فایل مقاله |
اشکال در دسترسی به فایل - ./files/site1/rds_journals/409/article-409-2062244.pdf |
| کد مقاله (doi) |
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| زبان مقاله منتشر شده |
en |
| موضوعات مقاله منتشر شده |
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