International Journal of Engineering، جلد ۳۰، شماره ۵، صفحات ۶۵۲-۶۵۸

عنوان فارسی
چکیده فارسی مقاله
کلیدواژه‌های فارسی مقاله

عنوان انگلیسی Estimation of Roughness Parameters of A Surface Using Different Image Enhancement Techniques (TECHNICAL NOTE)
چکیده انگلیسی مقاله Surface roughness measurement is widely used to estimate the quality of the product during manufacturing processes. It has a great importance in manufacturing fields such as ceramic tiles, glass, and iron. Many are using surface profile-meter with a contact stylus to measure the surface roughness of work piece. In the stylus method, a stylus is moved along the surface and the vertical movement of the stylus is recorded to measure surface roughness. This method has the disadvantage that work piece surface may damage due to direct contact between the surface and the stylus. In this paper, we propose a novel technique to find the roughness parameters of a surface by using image processing techniques like Contrast stretching and Bi-cubic interpolation techniques of image enhancement. In these techniques, firstly the surface image of the work pieces is acquired using the digital camera and it is pre-processed in order to remove noise and then image enhancement is done followed by parameters analysis. The roughness parameters such as average surface roughness (Ra), Maximum valley profile depth (Rv (Valley)), Highest peak (Rp (Peak)), Root-mean-square (rms) roughness (Rq (rms)) were determined using above techniques. The results obtained by the both methods are tabulated and compared.
کلیدواژه‌های انگلیسی مقاله

نویسندگان مقاله Beatrice Seventline J |
ECE department,, GITAM University,

BHASKARA RAO JANA |
ELECTRONICS AND COMMUNICATION ENGINEERING, Anil Neerukonda Institute of Technology& Sciences


نشانی اینترنتی http://www.ije.ir/article_72932_ccfa8517f74c9f6a3cbb9b66776aa4d5.pdf
فایل مقاله اشکال در دسترسی به فایل - ./files/site1/rds_journals/409/article-409-2062086.pdf
کد مقاله (doi)
زبان مقاله منتشر شده en
موضوعات مقاله منتشر شده
نوع مقاله منتشر شده
برگشت به: صفحه اول پایگاه   |   نسخه مرتبط   |   نشریه مرتبط   |   فهرست نشریات