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JCR 2016
جستجوی مقالات
جمعه 30 آبان 1404
International Journal of Engineering
، جلد ۳۵، شماره ۴، صفحات ۶۹۸-۷۰۵
عنوان فارسی
چکیده فارسی مقاله
کلیدواژههای فارسی مقاله
عنوان انگلیسی
Investigation of Dielectric Properties of Ni/n-TiO2/p-Si/Al Heterojunction in Wide Range of Temperature and Voltage
چکیده انگلیسی مقاله
In the present study we have investigated the dielectric properties such as dielectric constant (ε'), dielectric loss (ε"), real part of electrical modulus (M'), imaginary part of electric modulus (M") and AC electrical conductivity, (σ
ac
) in wide range of applied voltage, temperature and frequency for Ni/n-TiO
2
/p-Si/Al heterojunction. A nanocrystalline TiO
2
layer was grown on p-type boron doped silicon in oxygen-controlled environment using optimized KrF excimer laser. Ohmic contact of pure nickel and aluminum metals was made on TiO
2
and silicon respectively, with thermal coating system. The characteristics obtained with the help of conductance-voltage and capacitance-voltage measurements also known as impedance/admittance spectroscopy. The studied parameters are found to be very sensitive to frequency, temperature and voltage. The restructuring and reordering of interface state density due to temperature variations and interfacial polarizations due to frequency variations collectively result the observed changes in the and . With an increase in frequency AC conductivity and electrical modulus also increases. The relaxation mechanism can be observed in the complex electrical modulus analysis. The thermally activated conduction process was indicated by the frequency dependent AC conductivity at different temperatures. Using power law, the AC conductivity was analyzed and found to increase with temperature, applied voltage.
کلیدواژههای انگلیسی مقاله
Dielectric Constant,electric moduli,conductivity,interface states
نویسندگان مقاله
A. Kumar |
Department of Physics, Government College Sujanpur Tihra, India
A. Kumar |
Department of Physics and Photonics Science, National Institute of Technology, Hamirpur, India
K. K. Sharma |
Department of Physics and Photonics Science, National Institute of Technology, Hamirpur, India
نشانی اینترنتی
https://www.ije.ir/article_143172_a80eea9aea6860b4467c544424bdc012.pdf
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en
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